{"title":"3D profile measurements using 2D fringe projections in the tele-centric system","authors":"W. Su, Zhi-Hsiang Liu","doi":"10.1117/12.2677320","DOIUrl":null,"url":null,"abstract":"A 2D fringe pattern is presented for projected fringe profilometry in the tele-centric system. Compared with the methods which embeds multiple frequencies in one pattern, the proposed one-shot method is more tolerant to low signal-to-noise ratios and more reliable for surface with large color or reflectance variation.","PeriodicalId":434863,"journal":{"name":"Optical Engineering + Applications","volume":"247 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-10-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Engineering + Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2677320","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A 2D fringe pattern is presented for projected fringe profilometry in the tele-centric system. Compared with the methods which embeds multiple frequencies in one pattern, the proposed one-shot method is more tolerant to low signal-to-noise ratios and more reliable for surface with large color or reflectance variation.