W. Rezgui, N. Mouss, L. Mouss, M. Mouss, Y. Amirat, M. Benbouzid
{"title":"Faults modeling of the impedance and reversed polarity types within the PV generator operation","authors":"W. Rezgui, N. Mouss, L. Mouss, M. Mouss, Y. Amirat, M. Benbouzid","doi":"10.1109/EFEA.2014.7059979","DOIUrl":null,"url":null,"abstract":"In this paper, we proposed a new mathematical model of the I-V characteristic of a faulty photovoltaic generator. It presents its behavior in normal and faulty operations. In particular, when its basic components such as cells, bypass and blocking diodes are subjected to the impedance or reversed polarity faults. The developed model of the faulty PV generator will allow studying of the I-V characteristic, measures the tolerances of the technical functions, avoids numerous experiments, and ensure better assessment of fault consequences.","PeriodicalId":129568,"journal":{"name":"3rd International Symposium on Environmental Friendly Energies and Applications (EFEA)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"3rd International Symposium on Environmental Friendly Energies and Applications (EFEA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EFEA.2014.7059979","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
In this paper, we proposed a new mathematical model of the I-V characteristic of a faulty photovoltaic generator. It presents its behavior in normal and faulty operations. In particular, when its basic components such as cells, bypass and blocking diodes are subjected to the impedance or reversed polarity faults. The developed model of the faulty PV generator will allow studying of the I-V characteristic, measures the tolerances of the technical functions, avoids numerous experiments, and ensure better assessment of fault consequences.