J. Hwang, Jaehee Lee, Jong-Cheol Lee, D. Whang, S. Hwang
{"title":"Fabrication of graphene field-effect transistors by simple stripping from CVD-grown layers","authors":"J. Hwang, Jaehee Lee, Jong-Cheol Lee, D. Whang, S. Hwang","doi":"10.1109/NANO.2010.5697797","DOIUrl":null,"url":null,"abstract":"We develop a simple technique to fabricate graphene field-effect-transistor (FET) devices. Our technique is stripping graphene by scotch tape from the chemical vapor deposition (CVD)-grown layer, except the gap region between the source and drain electrode. The current-voltage (I–V) characteristic of a graphene FET before stripping shows a large zero-bias conductance of 6.5 mS and no gate operation. After stripping, the zero gate bias conductance of the device is reduced to 23 µS and a clear gate operation is observed. The change of FET characteristics before and after stripping is due to the formation of a urn size graphene flake. There is large potential that this one-step stripping technique can be extended to a more controllable method to fabricate graphene FET devices.","PeriodicalId":254587,"journal":{"name":"10th IEEE International Conference on Nanotechnology","volume":"2013 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"10th IEEE International Conference on Nanotechnology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NANO.2010.5697797","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
We develop a simple technique to fabricate graphene field-effect-transistor (FET) devices. Our technique is stripping graphene by scotch tape from the chemical vapor deposition (CVD)-grown layer, except the gap region between the source and drain electrode. The current-voltage (I–V) characteristic of a graphene FET before stripping shows a large zero-bias conductance of 6.5 mS and no gate operation. After stripping, the zero gate bias conductance of the device is reduced to 23 µS and a clear gate operation is observed. The change of FET characteristics before and after stripping is due to the formation of a urn size graphene flake. There is large potential that this one-step stripping technique can be extended to a more controllable method to fabricate graphene FET devices.