A Framework for Fault Tolerant Real Time Systems Based on Reconfigurable FPGAs

M. Gericota, Luís F. Lemos, G. Alves, Mario M. Barbosa, J. Ferreira
{"title":"A Framework for Fault Tolerant Real Time Systems Based on Reconfigurable FPGAs","authors":"M. Gericota, Luís F. Lemos, G. Alves, Mario M. Barbosa, J. Ferreira","doi":"10.1109/ETFA.2006.355409","DOIUrl":null,"url":null,"abstract":"To increase the amount of logic available to the users in SRAM-based FPGAs, manufacturers are using nanometric technologies to boost logic density and reduce costs, making its use more attractive. However, these technological improvements also make FPGAs particularly vulnerable to configuration memory bit-flips caused by power fluctuations, strong electromagnetic fields and radiation. This issue is particularly sensitive because of the increasing amount of configuration memory cells needed to define their functionality. A short survey of the most recent publications is presented to support the options assumed during the definition of a framework for implementing circuits immune to bit-flips induction mechanisms in memory cells, based on a customized redundant infrastructure and on a detection-and-fix controller.","PeriodicalId":431393,"journal":{"name":"2006 IEEE Conference on Emerging Technologies and Factory Automation","volume":"76 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE Conference on Emerging Technologies and Factory Automation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETFA.2006.355409","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

To increase the amount of logic available to the users in SRAM-based FPGAs, manufacturers are using nanometric technologies to boost logic density and reduce costs, making its use more attractive. However, these technological improvements also make FPGAs particularly vulnerable to configuration memory bit-flips caused by power fluctuations, strong electromagnetic fields and radiation. This issue is particularly sensitive because of the increasing amount of configuration memory cells needed to define their functionality. A short survey of the most recent publications is presented to support the options assumed during the definition of a framework for implementing circuits immune to bit-flips induction mechanisms in memory cells, based on a customized redundant infrastructure and on a detection-and-fix controller.
基于可重构fpga的容错实时系统框架
为了在基于sram的fpga中增加用户可用的逻辑数量,制造商正在使用纳米技术来提高逻辑密度并降低成本,使其使用更具吸引力。然而,这些技术改进也使fpga特别容易受到功率波动、强电磁场和辐射引起的配置存储器位翻转的影响。这个问题特别敏感,因为定义其功能所需的配置内存单元的数量在不断增加。本文对最新的出版物进行了简短的调查,以支持在定义基于自定义冗余基础设施和检测和修复控制器的存储单元中实现不受位翻转感应机制影响的电路的框架时所假设的选项。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信