Diagonal Hamming Based Multi-Bit Error Detection and Correction Technique for Memories

Abstract

Temporary errors which are classified under soft errors are created because of fluctuations in the voltage or external radiations. These errors are very common and obvious in memories. In this paper, Diagonal Hamming based multi-bit error detection and correction technique is proposed to identify errors to an extent of 8-bit. Rectification of 1, 2, 3, 4, 5 bit errors are possible. Few combinations of 6 and 7 random bit errors and burst errors of 8 bit are correctable. By using this method, high code rate is achieved with less area and delay when in contrast to various techniques.