Photoluminescence from tensile-strained Ge quantum dots

Qimiao Chen, Xiren Chen, Zhenpu Zhang, Yuxin Song, Peng Wang, Juanjuan Liu, P. Lu, Yaoyao Li, Q. Gong, Shumin Wang
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Abstract

Summary form only given. It has been theoretically predicted that 1.9% biaxial tensile strain can convert Ge, which is compatible with Si CMOS technology, into a direct band-gap semiconductor, making it a candidate material for light sources on Si. Combining the advantage of tensile strain with quantum dot (QD), we proposed that tensile-strained QD is a new route toward light emission from Ge. In this work, we chose In0.52Al0.48As, which is lattice matched to InP, as barrier layer and grew the structure by molecular beam epitaxy (MBE). Photoluminescence (PL) was successfully achieved at room temperature.
拉伸应变锗量子点的光致发光
只提供摘要形式。从理论上预测,1.9%的双轴拉伸应变可以将与Si CMOS技术兼容的Ge转化为直接带隙半导体,使其成为Si上光源的候选材料。结合拉伸应变与量子点(QD)的优点,提出了拉伸应变量子点是锗发光的新途径。本文选择了与InP晶格匹配的In0.52Al0.48As作为势垒层,并通过分子束外延(MBE)生长了该结构。在室温下成功地实现了光致发光。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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