Thermal modeling of the cooling of a power MOSFET by heat pipes

A. Driss, S. Maalej, M. Zaghdoudi
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引用次数: 1

Abstract

In this work, a model is developed in order to simulate the cooling of a power MOSFET by heat pipe systems. The MOSFET is modeled by a RC thermal circuit approach on the basis on its thermal characteristics delivered by the manufacturer. The heat pipe is also modeled by a RC thermal circuit. The thermal resistances and capacitances of the heat pipe model are determined by both experiments and theoretical calculations. The model aims to determine the junction temperature of the MOSFET as well as the heat pipe temperatures in response to a periodic heat input power as a function of different parameters such as the duty ratio, D, and the duration of the variant time heat input, Tp. The results indicate that for, a given duration Tp, the duty ratio affects the junction temperature which oscillates between minimum and maximum values. Moreover, the maximum and minimum junction temperatures increase with the duty ratio. For a given duty ratio, the junction temperature is also affected by the duration of the heat input power. The maximum junction temperature increases with Tp, however, the minimum junction temperature decreases as the heat input power duration increases. In all cases, the junction temperature values remain lower than the maximum ones allowed for the safety operation of the MOSFET.
热管冷却功率MOSFET的热模拟
在本工作中,为了模拟热管系统对功率MOSFET的冷却,建立了一个模型。基于制造商提供的热特性,采用RC热电路方法对MOSFET进行建模。热管也通过RC热电路建模。通过实验和理论计算确定了热管模型的热阻和热容。该模型旨在确定MOSFET的结温以及热管温度对周期性热输入功率的响应,并将其作为不同参数(如占空比D和变时间热输入持续时间Tp)的函数。结果表明,在给定的持续时间Tp内,占空比影响结温,结温在最小值和最大值之间振荡。最大和最小结温随占空比的增大而增大。对于给定的占空比,结温也受热输入功率持续时间的影响。最大结温随热输入功率的增加而增加,最小结温随热输入功率的增加而降低。在所有情况下,结温值都保持低于MOSFET安全运行所允许的最大值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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