Temperature Distribution Simulation in an MV Switchgear Bus Bar Chamber

Mijodrag Miljanovic, Martin Kearns, Brian G. Stewart
{"title":"Temperature Distribution Simulation in an MV Switchgear Bus Bar Chamber","authors":"Mijodrag Miljanovic, Martin Kearns, Brian G. Stewart","doi":"10.1109/CEIDP55452.2022.9985350","DOIUrl":null,"url":null,"abstract":"Temperature is one of the main contributors for the decrease of switchgear insulation withstand capability and life expectancy. Unattended temperature rise can lead to overheating of switchgear insulation causing insulation breakdown and hence switchgear outage. This work presents a simulation investigation of how temperature hot spots may be detected by studying the surface temperature distribution along a switchgear bus bar chamber wall. A three-dimensional (3-D) finite element method (FEM) MV switchgear bus bar chamber is created. The heat dissipation caused by bus bar load currents and thermal localized hot spots caused by increased contact resistances is investigated. It is shown that it may be possible to detect inner hot spots on the surface of switchgear chamber walls. It is also shown that the coating and the emissivity factor of the walls have a significant influence on the detected surface temperature.","PeriodicalId":374945,"journal":{"name":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"155 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP55452.2022.9985350","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Temperature is one of the main contributors for the decrease of switchgear insulation withstand capability and life expectancy. Unattended temperature rise can lead to overheating of switchgear insulation causing insulation breakdown and hence switchgear outage. This work presents a simulation investigation of how temperature hot spots may be detected by studying the surface temperature distribution along a switchgear bus bar chamber wall. A three-dimensional (3-D) finite element method (FEM) MV switchgear bus bar chamber is created. The heat dissipation caused by bus bar load currents and thermal localized hot spots caused by increased contact resistances is investigated. It is shown that it may be possible to detect inner hot spots on the surface of switchgear chamber walls. It is also shown that the coating and the emissivity factor of the walls have a significant influence on the detected surface temperature.
中压开关柜母线室温度分布仿真
温度是降低开关设备绝缘承受能力和预期寿命的主要因素之一。无人看管的温度升高会导致开关柜绝缘过热,导致绝缘击穿,从而导致开关柜停电。这项工作提出了如何通过研究沿开关柜母线室壁的表面温度分布来检测温度热点的模拟调查。建立了中压开关柜母线室的三维有限元模型。研究了母线负载电流引起的散热和接触电阻增大引起的热局部热点。结果表明,在开关柜室壁表面检测内部热点是可行的。结果表明,涂层和壁的发射系数对被测表面温度有显著影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信