Predicting Fault-Prone Software Modules with Rank Sum Classification

J. Cahill, J. Hogan, Richard N. Thomas
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引用次数: 23

Abstract

The detection and correction of defects remains among the most time consuming and expensive aspects of software development. Extensive automated testing and code inspections may mitigate their effect, but some code fragments are necessarily more likely to be faulty than others, and automated identification of fault prone modules helps to focus testing and inspections, thus limiting wasted effort and potentially improving detection rates. However, software metrics data is often extremely noisy, with enormous imbalances in the size of the positive and negative classes. In this work, we present a new approach to predictive modelling of fault proneness in software modules, introducing a new feature representation to overcome some of these issues. This rank sum representation offers improved or at worst comparable performance to earlier approaches for standard data sets, and readily allows the user to choose an appropriate trade-off between precision and recall to optimise inspection effort to suit different testing environments. The method is evaluated using the NASA Metrics Data Program (MDP) data sets, and performance is compared with existing studies based on the Support Vector Machine (SVM) and Naïve Bayes (NB) Classifiers, and with our own comprehensive evaluation of these methods.
基于秩和分类的易故障软件模块预测
缺陷的检测和纠正仍然是软件开发中最耗时和最昂贵的方面之一。广泛的自动化测试和代码检查可能会减轻它们的影响,但是一些代码片段必然比其他代码片段更有可能出错,而容易出错模块的自动识别有助于集中测试和检查,从而限制了浪费的努力,并潜在地提高了检测率。然而,软件度量数据通常非常嘈杂,在正类和负类的大小上存在巨大的不平衡。在这项工作中,我们提出了一种新的软件模块故障倾向预测建模方法,引入了一种新的特征表示来克服这些问题。这种秩和表示为标准数据集提供了改进的或最坏的可比较性能,并且很容易允许用户在精度和召回率之间选择适当的权衡,以优化检查工作,以适应不同的测试环境。使用NASA Metrics Data Program (MDP)数据集对该方法进行了评估,并将其性能与基于支持向量机(SVM)和Naïve贝叶斯(NB)分类器的现有研究进行了比较,并对这些方法进行了我们自己的综合评估。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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