Effects of Conducted Interference on a Microcontroller Based on IEC 62132-4 and IEC 62215-3

Felix Burghardt, H. Garbe
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引用次数: 3

Abstract

Due to short traces inside a microcontroller (e.g. die, bond wires), the effects of coupled electromagnetic far fields below 1GHz can be neglected. For this reason, it can be assumed that a microcontroller is only influenced by conducted interference as long as these coupled-in far field interference signals are not higher than 1GHz. IEC62132-4 and IEC62215-3 describe the procedure for such examinations. In this work, the structure of a test board, which is required for the analysis of an 8-pin microcontroller, is described. In addition, a procedure is shown, how the corresponding peripheral circuits are designed and how the immunity of a microcontroller is determined. Finally, the question is clarified whether, based on the behavior of individual pins, conclusions can be drawn about all pins of the microcontroller.
基于iec62132 -4和iec62215 -3的传导干扰对单片机的影响
由于微控制器内部的走线较短(例如,芯片,键合线),1GHz以下耦合电磁远场的影响可以忽略不计。因此,只要这些耦合的远场干扰信号不高于1GHz,就可以假设微控制器只受到传导干扰的影响。IEC62132-4和IEC62215-3描述了这种检查的程序。在这项工作中,描述了分析8针微控制器所需的测试板的结构。此外,还给出了相应外围电路的设计过程以及微控制器抗扰度的确定方法。最后,问题是澄清,是否基于单个引脚的行为,可以得出关于微控制器的所有引脚的结论。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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