Effects of Conducted Interference on a Microcontroller Based on IEC 62132-4 and IEC 62215-3

Abstract

Due to short traces inside a microcontroller (e.g. die, bond wires), the effects of coupled electromagnetic far fields below 1GHz can be neglected. For this reason, it can be assumed that a microcontroller is only influenced by conducted interference as long as these coupled-in far field interference signals are not higher than 1GHz. IEC62132-4 and IEC62215-3 describe the procedure for such examinations. In this work, the structure of a test board, which is required for the analysis of an 8-pin microcontroller, is described. In addition, a procedure is shown, how the corresponding peripheral circuits are designed and how the immunity of a microcontroller is determined. Finally, the question is clarified whether, based on the behavior of individual pins, conclusions can be drawn about all pins of the microcontroller.