An insight into UWB interference from a shot noise perspective

Abstract

This paper considers the effects of UWB interference on narrowband systems from the perspective of that of a shot noise random process. Shot noise is perhaps best known as the time-dependent fluctuations in electrical current caused by the discrete nature of the electron charge in such devices as tunnel diodes, Schottky barrier diodes and P-N junctions. Here, the discrete nature of the UWB-excited impulse response of a victim receiver is shown, under mild conditions, to behave as shot noise. The statistical properties of the receiver output are then compared with measurement results obtained to date by the National Telecommunications and Information Administration (NTIA), Stanford University and the Department of Transportation (DOT), and others.