{"title":"Computer-aided design for VLSI","authors":"S.M. Kang","doi":"10.1109/CICCAS.1991.184233","DOIUrl":null,"url":null,"abstract":"New CAD issues related to MOS VLSI and optoelectronic integration technologies are reviewed. Especially, new issues on performance and timing driven physical layout, design for VLSI manufacturability and reliability using time-efficient simulation technologies are discussed. In contrast, CAD issues in optoelectronics are presently at the device modeling and circuit simulation level. CAD environments that support fast turnaround model development and circuit verification are discussed with specific optical device models of semiconductor lasers, photodetectors and optical logic gates.<<ETX>>","PeriodicalId":119051,"journal":{"name":"China., 1991 International Conference on Circuits and Systems","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"China., 1991 International Conference on Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICCAS.1991.184233","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
New CAD issues related to MOS VLSI and optoelectronic integration technologies are reviewed. Especially, new issues on performance and timing driven physical layout, design for VLSI manufacturability and reliability using time-efficient simulation technologies are discussed. In contrast, CAD issues in optoelectronics are presently at the device modeling and circuit simulation level. CAD environments that support fast turnaround model development and circuit verification are discussed with specific optical device models of semiconductor lasers, photodetectors and optical logic gates.<>