Determination of Abnormality of IGBT Images Using VGG16

Abstract

A power device is a semiconductor device for power control used for power conversion such as converting direct current to alternating current and alternating current to direct current. It is widely used such as refrigerators, air conditioners which is implemented electronic components that are closely related to our daily lives. Therefore, high reliability and safety are required, and power cycle tests are conducted for the purpose of evaluating them. In the conventional test, there is a problem that it is difficult to perform analysis because sparks are generated during the test and the device is severely damaged after the test. To solve this problem, a new technology has been developed that adds ultrasonic that enable internal observation during the test. However, there are remains a problem that the method for analyzing the ultrasonic image obtained in the new technology has not been established. Also, few abnormal images are obtained in the test. In this paper, we propose a method for detection of abnormal devices based on CNN. Especially, we implement a Cycle-GAN to extend the abnormal data and classify the known image based on improved VGG16. As an experimental result, classification accuracy of Precision = 97.06%, Recall = 93.58%, $F$ - measure = 95.17% were obtained.