A pre-processing method for degradation parameter

Abstract

In the application of lifetime prediction, sometimes the degradation parameter would be disturbed due to the unstable environment. This phenomenon is negative to the prediction of the lifetime and reliability. So we take Super-luminescent Diode (SLD) as an example, to research the method of degradation parameter pre-processing method under the temperature stress. Firstly, analyze the relationship between degradation variable and unstable environment variable of the parameter. Secondly, remove the unstable environment variable by modeling method based on Support Vector Machines (SVM) and filtering method based on wavelet analysis. Finally, the pre-processing of the degradation parameter is finished, and then the accuracy of the lifetime prediction is improved.