CHARACTERIZATION OF MATERIALS FOR MOLECULAR ELECTRONICS AND DATA STORAGE BY SOFT X-RAY SPECTROSCOPY

Abstract

SINS is a soft X-ray spectroscopy facility at SSLS, dedicated to Surface, Interface and Nanostructure Science of advanced materials. Developed over the past few years, the SINS end-station includes a photoemission spectroscopy analyzer, LEED, in situ STM/AFM, and a separate sample preparation chamber. Applications to such fields as molecular electronics, high density data storage, and nanonetwork templates are briefly reviewed.