{"title":"A Method for Reliability Increasing Test of Wireless Base Station Product","authors":"Yu Susheng, Deng Jie","doi":"10.1109/GSMM.2008.4534561","DOIUrl":null,"url":null,"abstract":"This paper has described the general process that reliability of wireless base station product is increased by using HALT test technique. For example, the HALT test process of wireless base station type A and its reliability enhancement is described.","PeriodicalId":304483,"journal":{"name":"2008 Global Symposium on Millimeter Waves","volume":"89 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 Global Symposium on Millimeter Waves","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GSMM.2008.4534561","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper has described the general process that reliability of wireless base station product is increased by using HALT test technique. For example, the HALT test process of wireless base station type A and its reliability enhancement is described.