Analytical Imaging of Cultural Heritage by Synchrotron Radiation and Visible Light - near Infrared Spectroscopy

J. A. Toque, Y. Sakatoku, Julia Anders, Y. Murayama, A. Ide-Ektessabi
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引用次数: 5

Abstract

Imaging is an important tool for analyzing cultural heritage. Due to its delicate nature, the analysis presents numerous technical challenges, probably the most important of which is its requirement for non-destructive and non-invasive investigation. In this study, two techniques used in the analysis of cultural heritage are presented. The first one, synchrotron radiation x-ray fluorescence, is an advanced analytical technique with high accuracy and good spatial resolution. On the other hand, spectroscopic technique based on visible light-near infrared spectrum is becoming popular due to some information that it can provide, which are not available even in advanced analytical techniques. These two techniques were used to analyze real cultural heritage such as an ancient Mongolian textile, traditional Korean painting and commonly used pigments in Japanese paintings. The results revealed that using synchrotron radiation-based techniques is sometimes not enough in providing critical information (e.g. spectral reflectance, color, etc.) necessary for understanding of cultural heritage. This can be complemented using visible light-near infrared technique.
文物同步辐射与可见光-近红外光谱分析成像
影像是分析文化遗产的重要工具。由于其微妙的性质,该分析提出了许多技术挑战,其中最重要的可能是它对非破坏性和非侵入性调查的要求。在本研究中,介绍了两种用于文化遗产分析的技术。第一种是同步辐射x射线荧光,它是一种精度高、空间分辨率好的先进分析技术。另一方面,基于可见光-近红外光谱的光谱技术由于可以提供一些即使在先进的分析技术中也无法获得的信息而受到欢迎。这两种技术被用于分析蒙古古代纺织品、韩国传统绘画和日本绘画常用颜料等真实的文化遗产。结果表明,使用基于同步辐射的技术有时不足以提供了解文化遗产所必需的关键信息(如光谱反射率、颜色等)。这可以用可见光-近红外技术加以补充。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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