Small-Size low losses WLAN and GSM/DCS diplexers integrated in a low cost 130 nm high resistivity SOI CMOS technology

F. Gianesello, A. Giry, S. Jan, S. Boret, O. Bon, D. Gloria, B. Rauber, C. Raynaud
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引用次数: 3

Abstract

RF front end module (FEMs) are currently realized using a variety of technologies. However, since integration drives wireless business in order to achieve the appropriate cost and form factor, we see significant research concerning FEM integration on silicon [1]. In this quest, SOI technology has already addressed two key blocks, the antenna switch and the power amplifier. In this paper, we will focus our investigation on high performance passives functions in order to demonstrate the capability of SOI CMOS technology to integrate the whole FEM. To do so, WLAN and GSM/DCS diplexers have been achieved in a 130 nm SOI CMOS technology. Measured performances (insertion losses ~1dB and isolation greater than 20 dB) are clearly competitive with most commercially available Integrated Device Passive (IPD) solutions.
小尺寸低损耗WLAN和GSM/DCS双工器集成在低成本130纳米高电阻率SOI CMOS技术
射频前端模块(fem)目前使用多种技术实现。然而,由于集成驱动无线业务以实现适当的成本和外形因素,我们看到关于硅上FEM集成的重要研究[1]。在这个探索中,SOI技术已经解决了两个关键模块,天线开关和功率放大器。在本文中,我们将重点研究高性能无源功能,以证明SOI CMOS技术集成整个FEM的能力。为此,WLAN和GSM/DCS双工器已在130 nm SOI CMOS技术中实现。测量的性能(插入损耗~1dB和隔离大于20db)显然与大多数市售的集成器件无源(IPD)解决方案具有竞争力。
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