Novel measurement method of ion impurity in OPV materials

Abstract

We have demonstrated the measurement of the concentration of ion impurities in organic photovoltaic (OPV) materials by using a transient current measurement method that has been developed for the screening and the optimization of thin film transistor-liquid crystal displays since 1993. We speculate that ion impurity has impact on an efficiency and lifetime of OPV devices and confirm that there is a remarkable correlation between the concentration of ion impurity and the OPV characteristics.