{"title":"Static and dynamic characteristics of the integrated assessment of the radiation resistance of LSI of the hardware means of information protection","authors":"V. M. Barbashov, N. S. Trushkin, V. G. Ivanenko","doi":"10.26583/bit.2022.1.02","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":278246,"journal":{"name":"Bezopasnost informacionnyh tehnology","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Bezopasnost informacionnyh tehnology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.26583/bit.2022.1.02","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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