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Improving Robustness of Dual Port SRAM by finding additional bugs in design using ESPCV flow to compare Schematics v/s Verilog on 12LP GF Technology as an example

International Journal of Innovative Research in Applied Sciences and Engineering Pub Date : 2019-07-01 DOI:10.29027/ijirase.v3.i11.2019.423-427
Sneha Sharma, Madhu Shandilya, O. P. Meena, Naresh Gandham
{"title":"Improving Robustness of Dual Port SRAM by finding additional bugs in design using ESPCV flow to compare Schematics v/s Verilog on 12LP GF Technology as an example","authors":"Sneha Sharma, Madhu Shandilya, O. P. Meena, Naresh Gandham","doi":"10.29027/ijirase.v3.i11.2019.423-427","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":447225,"journal":{"name":"International Journal of Innovative Research in Applied Sciences and Engineering","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Innovative Research in Applied Sciences and Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.29027/ijirase.v3.i11.2019.423-427","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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以12LP GF技术上的Schematics v/s Verilog为例，利用ESPCV流比较设计中的附加缺陷，提高双端口SRAM的鲁棒性
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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International Journal of Innovative Research in Applied Sciences and Engineering
International Journal of Innovative Research in Applied Sciences and Engineering
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