Power Calculations for Overmoded High Power Millimeter-Wave Devices

A. Elfrgani, J. Vijayamohanan, J. Giese, A. Kuskov, N. Burt, E. Schamiloglu
{"title":"Power Calculations for Overmoded High Power Millimeter-Wave Devices","authors":"A. Elfrgani, J. Vijayamohanan, J. Giese, A. Kuskov, N. Burt, E. Schamiloglu","doi":"10.1109/icops45751.2022.9812957","DOIUrl":null,"url":null,"abstract":"The microwave electronic efficiency of high-power microwave devices is derived from the ratio of total radiated power to input electron beam power. In this work, we are exploring different approaches to calculate the radiated power from high-power microwave and millimeter-wave devices. The total radiated power is usually obtained by integrating the measured radiation pattern in the far-field. For high-power microwave experiments, it is only possible to collect a limited number of data to estimate the total power. In addition, it is a challenge to map the radiation pattern in both the horizontal and vertical planes. One possible way is by fitting the data points using a curve fitting tool to find a mathematical expression and then integrating the function over the solid angle regardless of the operating mode. The power pattern data points can be interpreted as the radiation power density or the radiation power intensity. That is valid for the far-field region, which is not always possible for millimeter-wave range.","PeriodicalId":175964,"journal":{"name":"2022 IEEE International Conference on Plasma Science (ICOPS)","volume":"11 5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE International Conference on Plasma Science (ICOPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/icops45751.2022.9812957","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

The microwave electronic efficiency of high-power microwave devices is derived from the ratio of total radiated power to input electron beam power. In this work, we are exploring different approaches to calculate the radiated power from high-power microwave and millimeter-wave devices. The total radiated power is usually obtained by integrating the measured radiation pattern in the far-field. For high-power microwave experiments, it is only possible to collect a limited number of data to estimate the total power. In addition, it is a challenge to map the radiation pattern in both the horizontal and vertical planes. One possible way is by fitting the data points using a curve fitting tool to find a mathematical expression and then integrating the function over the solid angle regardless of the operating mode. The power pattern data points can be interpreted as the radiation power density or the radiation power intensity. That is valid for the far-field region, which is not always possible for millimeter-wave range.
超模高功率毫米波器件的功率计算
大功率微波器件的微波电子效率来源于总辐射功率与输入电子束功率的比值。在这项工作中,我们正在探索不同的方法来计算大功率微波和毫米波器件的辐射功率。总辐射功率通常是通过对远场测量的辐射方向图进行积分得到的。对于高功率微波实验,只能收集有限数量的数据来估计总功率。此外,在水平和垂直平面上绘制辐射方向图也是一个挑战。一种可能的方法是使用曲线拟合工具拟合数据点,找到数学表达式,然后在立体角上对函数积分,而不管操作模式如何。功率图数据点可以解释为辐射功率密度或辐射功率强度。这对于远场区域是有效的,而对于毫米波范围并不总是可能的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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