TLP measurements for verification of ESD protection device response

Abstract

Transmission line pulsers, commonly known as TLPs, have been used for many years to calibrate diagnostics, and provide precise high-voltage and high-current waveforms. The pulsers have been used to qualify the ESD response of many ESD protection circuits and devices (Rector and Hyatt, 1998; Gieser and Egger, 1996; Maloney and Khurana, 1985). TLP applications cover a wider range of uses beyond estimating the ESD susceptibility of device level protection circuits. TLPs have been used to certify many ESD suppression devices including: device level ESD protection circuits, metal oxide varistors (MOV), Transorbs, composite voltage variable materials (VVM), diodes, spark gaps, and occasionally, even capacitors and resistors. This paper describes a simplified, yet general, TLP circuit and method called time domain transmission (TDT) mode testing. The method differs from and is compared to time domain reflection (TDR) mode measurement techniques.