High mobility SnO2 TFT for display and future IC

A. Chin, C. Shih, Chun-Fu Lu, W. Su
{"title":"High mobility SnO2 TFT for display and future IC","authors":"A. Chin, C. Shih, Chun-Fu Lu, W. Su","doi":"10.1109/AM-FPD.2016.7543695","DOIUrl":null,"url":null,"abstract":"Very high mobility of 149~189 cm<sup>2</sup>/Vs, large on-to-off current ratio (I<sub>ON</sub>/I<sub>Off</sub>) of >7 orders of magnitude, fast turn-on sub-threshold swing of 110 mV/decade, and low power operation at 2~2.5 V were achieved in SnO<sub>2</sub> TFT device at an ultra-thin SnO<sub>2</sub> thickness of 4.5 nm. The device mobility of SnO<sub>2</sub> TFT is higher than the best ZnO-based TFTs and CVD-grown multi-layers MoS<sub>2</sub> MOSFETs. The reached mobility is already 0.7 times of universal mobility of SiO<sub>2</sub>/Si nMOSFET, operated typically at >1 MV/cm field. The very high mobility, simple low temperature process, and ultra-thin body SnO<sub>2</sub> transistor should find its crucial role for high resolution display, future sub-10 nm nMOSFET and brain-mimicking 3D IC.","PeriodicalId":422453,"journal":{"name":"2016 23rd International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD)","volume":"212 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 23rd International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AM-FPD.2016.7543695","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Very high mobility of 149~189 cm2/Vs, large on-to-off current ratio (ION/IOff) of >7 orders of magnitude, fast turn-on sub-threshold swing of 110 mV/decade, and low power operation at 2~2.5 V were achieved in SnO2 TFT device at an ultra-thin SnO2 thickness of 4.5 nm. The device mobility of SnO2 TFT is higher than the best ZnO-based TFTs and CVD-grown multi-layers MoS2 MOSFETs. The reached mobility is already 0.7 times of universal mobility of SiO2/Si nMOSFET, operated typically at >1 MV/cm field. The very high mobility, simple low temperature process, and ultra-thin body SnO2 transistor should find its crucial role for high resolution display, future sub-10 nm nMOSFET and brain-mimicking 3D IC.
用于显示和未来集成电路的高迁移率SnO2 TFT
在厚度为4.5 nm的超薄SnO2 TFT器件中,实现了149~189 cm2/Vs的高迁移率、高达7个数量级的大通断电流比(ION/IOff)、110 mV/ 10年的快速导通亚阈值摆幅和2~2.5 V的低功耗工作。SnO2 TFT的器件迁移率高于最佳的zno基TFT和cvd生长的多层MoS2 mosfet。达到的迁移率已经是SiO2/Si nMOSFET通用迁移率的0.7倍,通常工作在>.1 MV/cm的电场下。高迁移率、简单低温工艺和超薄体SnO2晶体管将在高分辨率显示、未来的10nm以下nMOSFET和模拟大脑的3D集成电路中发挥重要作用。
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