Scalable behavior modeling for nano crossbar ESD protection structures by Verilog-A

Li Wang, Xin Wang, Zitao Shi, R. Ma, Jian Liu, Z. Dong, Chen Zhang, Fei Lu, L. Lin, H Zhao, Albert Z. H. Wang, Yuhua Cheng
{"title":"Scalable behavior modeling for nano crossbar ESD protection structures by Verilog-A","authors":"Li Wang, Xin Wang, Zitao Shi, R. Ma, Jian Liu, Z. Dong, Chen Zhang, Fei Lu, L. Lin, H Zhao, Albert Z. H. Wang, Yuhua Cheng","doi":"10.1109/NANO.2013.6720949","DOIUrl":null,"url":null,"abstract":"This paper reports a new scalable behavioral modeling technique for novel nano crossbar ESD protection structures using Verilog-A language. Accurate models for nano crossbar ESD protection structures with different sizes were developed, which were validated by circuit level simulation and transmission line pulsing ESD measurement.","PeriodicalId":189707,"journal":{"name":"2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO 2013)","volume":"71 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO 2013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NANO.2013.6720949","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

This paper reports a new scalable behavioral modeling technique for novel nano crossbar ESD protection structures using Verilog-A language. Accurate models for nano crossbar ESD protection structures with different sizes were developed, which were validated by circuit level simulation and transmission line pulsing ESD measurement.
基于Verilog-A的纳米交叉棒ESD保护结构的可扩展行为建模
本文报道了一种基于Verilog-A语言的新型纳米交叉棒ESD保护结构的可扩展行为建模技术。建立了不同尺寸纳米交叉棒ESD保护结构的精确模型,并通过电路级仿真和传输线脉冲ESD测量对模型进行了验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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