{"title":"Application of Fault Parallelism to the Automatic Test Pattern Generation for Sequential Circuits","authors":"P. A. Krauss, K. Antreich","doi":"10.1007/3-540-57307-0_38","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":390104,"journal":{"name":"Parallel Computer Architectures","volume":"424 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Parallel Computer Architectures","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/3-540-57307-0_38","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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