Experimental and simulation studies of single-electron-transistor-based multiple-valued logic

H. Inokawa, Yasuo Takahashi
{"title":"Experimental and simulation studies of single-electron-transistor-based multiple-valued logic","authors":"H. Inokawa, Yasuo Takahashi","doi":"10.1109/ISMVL.2003.1201415","DOIUrl":null,"url":null,"abstract":"Periodic drain current-gate voltage characteristics of single-electron transistors (SETs) were utilized to construct basic components of multiple-valued logic (MVL), such as a universal literal gate and a quantizer. In order to supplement the small gain and the small applicable voltage of the SET, hybrid SET-MOSFET scheme is proposed and demonstrated experimentally using CMOS-compatible pattern-dependent oxidation (PADOX) technology. We also succeeded in reproducing the results using a SPICE circuit simulator with a compact analytical SET model, and estimated the performance of the proposed MVL.","PeriodicalId":434515,"journal":{"name":"33rd International Symposium on Multiple-Valued Logic, 2003. Proceedings.","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"23","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"33rd International Symposium on Multiple-Valued Logic, 2003. Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISMVL.2003.1201415","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 23

Abstract

Periodic drain current-gate voltage characteristics of single-electron transistors (SETs) were utilized to construct basic components of multiple-valued logic (MVL), such as a universal literal gate and a quantizer. In order to supplement the small gain and the small applicable voltage of the SET, hybrid SET-MOSFET scheme is proposed and demonstrated experimentally using CMOS-compatible pattern-dependent oxidation (PADOX) technology. We also succeeded in reproducing the results using a SPICE circuit simulator with a compact analytical SET model, and estimated the performance of the proposed MVL.
基于单电子晶体管的多值逻辑的实验与仿真研究
利用单电子晶体管(set)的周期性漏极电流-栅极电压特性来构建多值逻辑(MVL)的基本元件,如通用文字门和量化器。为了弥补SET的增益小、适用电压小的缺点,提出了一种基于cmos兼容模式依赖氧化(PADOX)技术的混合SET- mosfet方案,并进行了实验验证。我们还使用SPICE电路模拟器和紧凑的解析SET模型成功地再现了结果,并估计了所提出的MVL的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信