{"title":"Forecasting Problems in Cybersecurity: Applying Econometric Techniques to Measure IT Risk","authors":"Baidyanath Biswas, S. Patra","doi":"10.1201/9780429424878-3","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":318481,"journal":{"name":"Computer and Cyber Security","volume":"140 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Computer and Cyber Security","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9780429424878-3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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