A study of the F.I.R. stress induced photoconductivity in gallium doped Germanium

J. Leotin, C. Laverny, R. Barbaste, D. Ricart, S. Askénazy, J. Birch
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Abstract

A simple instrument for the study of stress induced photoconductivity at 4.2 K is described. The specimen is mounted between sapphire and copper berylium anvils and illuminated through the sapphire. Performance is illustrated by the results of broad band measurements on gallium doped germanium.
掺镓锗中红外应力诱导光电导率的研究
介绍了一种用于研究4.2 K下应力诱导光电导率的简易仪器。样品被安装在蓝宝石和铜铍砧之间,并通过蓝宝石照射。对掺镓锗的宽带测量结果说明了其性能。
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