Fabrication and Performance Analysis of AZO and MCCO as Thin Film-Thermoelectric Generator Materials

Elysa Nensy Irawan, Fahrur Aslami, Aldo Mahendra Putra, S. Thaowankaew, W. Namhongsa, A. Vora–ud, K. Singsoog, Tosawat Seetawan4, M. S. Muntini
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Abstract

The purpose of this research was to determine the performance of AZO and MCCO materials as constituents of the thin film-thermoelectric generator module. The method used for fabrication is DC Magnetron Sputtering. The electrode material used is Ag and the substrate used is SiO2 glass. The arrangement of the thin film used for the fabrication of the thermoelectric module is P-N-P-N-P-N-P-N-P-N (5 couples of p-n junctions). Based on the test results, the thickness of the thin film type N is 74.72 nm and type P is 90.34 nm. At the highest test temperature (300 oC), the AZO Seebeck coefficient value is -108 µV/K while the MCCO Seebeck coefficient value is 350 µV/K, and the AZO electrical resistivity value is 0.07 Ω.m while the MCCO electrical resistivity value is 0.36 Ω.m. The highest temperature difference given in the test of the AZO and MCCO thin film thermoelectric module is 1.538 °C and the thermoelectric module can produce a voltage of 1,842 ± 0.047 mV, a Seebeck coefficient of 4 µV/K, and an efficiency of 0.44%. Based on this research, it can be concluded that the performance of AZO and MCCO thin film-thermoelectric modules will have better performance at temperatures around 300 - 350 °C.
AZO和mco薄膜热电发生器材料的制备及性能分析
本研究的目的是确定AZO和mco材料作为薄膜热电发生器组件的组成部分的性能。制作方法为直流磁控溅射。电极材料为Ag,衬底为SiO2玻璃。用于制作热电模块的薄膜排列为p-n - p-n - p-n - p-n - p-n(5对p-n结)。根据测试结果,N型薄膜的厚度为74.72 nm, P型薄膜的厚度为90.34 nm。在最高测试温度(300℃)下,AZO的塞贝克系数值为-108 μ V/K, MCCO的塞贝克系数值为350 μ V/K, AZO的电阻率值为0.07 Ω。m, MCCO电阻率值为0.36 Ω.m。在AZO和mco薄膜热电模块测试中给出的最高温差为1.538℃,热电模块可以产生1842±0.047 mV的电压,塞贝克系数为4µV/K,效率为0.44%。基于本研究,可以得出AZO和MCCO薄膜热电模块在300 ~ 350℃温度下具有更好的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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