Test submicron integrated circuit for wideband RF short-distance locator with noise modulation

Abstract

Test submicron application specific Integrated Circuit (IC) for wideband RF short-distance locator is described. IC has been developed and manufactured using 130 nm silicon CMOS technology. Results of test IC elements measurements are presented, including RF oscillator 10 GHz, frequency divider by 32 (10 GHz to 312.5 MHz), noise generator and custom RF pads.