{"title":"The Evaluation of Efficiency of the Built-in Test Equipment of Electronic Devices of Control Systems","authors":"V. Stupak","doi":"10.1109/SIBCON.2007.371293","DOIUrl":null,"url":null,"abstract":"Electronic devices of control systems are under analysis. The method of an evaluation of an index of efficiency of the built-in test equipment, which provides definition of probability of diagnosing with application of the given means of a non serviceability state of the electronic device, is offered.","PeriodicalId":131657,"journal":{"name":"2007 Siberian Conference on Control and Communications","volume":"60 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-04-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 Siberian Conference on Control and Communications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIBCON.2007.371293","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Electronic devices of control systems are under analysis. The method of an evaluation of an index of efficiency of the built-in test equipment, which provides definition of probability of diagnosing with application of the given means of a non serviceability state of the electronic device, is offered.