Xiaohan Liu, Xiaoqiang Chen, Ying Wang, Tao Chen, Yalan Wang
{"title":"Analysis of Symmetric Step-up Topology Based on a Parallel-Connected 18-pulse Auto-transformer","authors":"Xiaohan Liu, Xiaoqiang Chen, Ying Wang, Tao Chen, Yalan Wang","doi":"10.1109/AEES56284.2022.10079545","DOIUrl":null,"url":null,"abstract":"For enable the multi-pulse auto-transformer rectifier unit (ATRU) can well meet a variety of step-up industrial occasions, an 18-pulse ATRU is proposed by considering in needs of small equivalent volume and simple structure. The topology of the proposed is designed, the step-up range is given, the step-up working principle is analyzed, and the relationship between the step-up factor and the equivalent volume of the used magnetic device is derived. It has high robustness and reliability.","PeriodicalId":227496,"journal":{"name":"2022 3rd International Conference on Advanced Electrical and Energy Systems (AEES)","volume":"316 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 3rd International Conference on Advanced Electrical and Energy Systems (AEES)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AEES56284.2022.10079545","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
For enable the multi-pulse auto-transformer rectifier unit (ATRU) can well meet a variety of step-up industrial occasions, an 18-pulse ATRU is proposed by considering in needs of small equivalent volume and simple structure. The topology of the proposed is designed, the step-up range is given, the step-up working principle is analyzed, and the relationship between the step-up factor and the equivalent volume of the used magnetic device is derived. It has high robustness and reliability.