A test system for the front-end electronics of the PADME charged particle detector system

Abstract

The PADME charged particle detector system aims to detect positrons and electrons with efficiency better than 99 % and time resolution below 1 ns. The system hosts about 200 readout electronics channels whose operation has to be verified and commissioned. A custom based test system allowing performing qualitative check of the detector and the front-end electronics has been developed. The initial tests and the performance of the front-end electronics are described and discussed. Time resolution better than 400 ps was achieved.