A 3V 15b 157μW Cryo-CMOS DAC for Multiplexed Spin-Qubit Biasing

Luc Enthoven, J. V. Staveren, Jiang Gong, M. Babaie, F. Sebastiano
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引用次数: 4

Abstract

This paper presents a 15b cryo-CMOS DAC for multiplexed spin-qubit biasing implemented in a 22-nm FinFET process. The integrating-DAC architecture and the robust digitally-assisted high-voltage output stage enable a low power dissipation (157μW) and small area (0.08mm2) independent of the number of biased qubits, and a 3V output range well beyond the nominal supply. This represents the first scalable solution for cryo-CMOS qubit biasing, which achieves a 1.8× better voltage resolution with a lower DNL over a 3× larger output range than the current state-of-the-art.
用于多路自旋-量子位偏置的3V 15b 157μW Cryo-CMOS DAC
本文提出了一种用于多路自旋量子位偏置的15b cro - cmos DAC,实现于22nm FinFET工艺中。集成dac架构和强大的数字辅助高压输出级使其具有低功耗(157μW)和小面积(0.08mm2),与偏置量子比特的数量无关,以及远远超出标称电源的3V输出范围。这代表了cryo-CMOS量子比特偏置的第一个可扩展解决方案,与目前最先进的输出范围相比,它实现了1.8倍的电压分辨率和更低的DNL,输出范围提高了3倍。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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