{"title":"Testing and Formal Verification of Decoder Circuit","authors":"Indu Bhuria, P. Inaniya, P. Kaler","doi":"10.1109/ACCT.2012.111","DOIUrl":null,"url":null,"abstract":"Testing of 2-to-4 decoder circuit are been done using tetraMAX. It is observed that 54 possible stuck-at faults can be there in the 2-to-4 decoder circuit, tetraMAX ATPG can provide test coverage of 100 % Using design compiler. db file is generated which is used for functional verification of the design with respect to RTL design. Compare points are shown by cone views of the design.","PeriodicalId":396313,"journal":{"name":"2012 Second International Conference on Advanced Computing & Communication Technologies","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-01-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 Second International Conference on Advanced Computing & Communication Technologies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ACCT.2012.111","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Testing of 2-to-4 decoder circuit are been done using tetraMAX. It is observed that 54 possible stuck-at faults can be there in the 2-to-4 decoder circuit, tetraMAX ATPG can provide test coverage of 100 % Using design compiler. db file is generated which is used for functional verification of the design with respect to RTL design. Compare points are shown by cone views of the design.