The chaotic characteristics of transistor noise at low frequency

Abstract

For a long time, people have described the transistor noise at low frequency with the theory of random process. In this paper, based on reconstructing phase space of the transistor EN noise time series, the nonlinear dynamic parameters are studied. The results of our study demonstrated that the transistor EN noise at low frequency has a limited fractional dimension, besides that, the largest Lyapunov exponent of the transistor EN noise is positive, so we can draw the conclusion that the transistor EN noise at low frequency has some chaotic characteristics.