TIM Coverage Evaluation for High Performance Computing Application

Shan Lin, Ken Zhang, V. Lin, David Lai, Y. Wang
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引用次数: 1

Abstract

High performance computing (HPC) system are improving computing performance to meet ever-increasing challenge continuously, such as high-end central processing unit (CPU) and server. Regarding this requirement, the high thermal conductivity (High-K) thermal interface material (TIM) which between die top surface and heat spreader in EHS-FCBGA is developed to solve the overheating problem. Although there have been many research on materials with high-K TIM in the recent years, the TIM coverage is also one of the most influential factors in high power requirement. At the beginning of the product life (T0), the silicone-based TIM coverage is usually maintained above 95%, but it always occurs the void or delamination issue after reliability test such as TCT and HTSL test which in turn affects the actual application. In summary, the optimization of TIM coverage evaluation after reliability test is inevitable.For system level cooling, the bulk of the heat is normally dissipated through the top of the package. However, thermal resistance junction-to-case (Theta JC) was usually used to judge the thermal performance of upward heat dissipation for package level, which is not enough to explain the overall thermal behavior from system level. In view of that, the maximum junction temperature (Tj) which contain overall thermal characterization is used to define the limitation of TIM coverage in this research.In this study, we present a method which can define the TIM coverage limitation with thermal design power (TDP) up to 100~500W for EHS-FCBGA in different package size and die/package ratio under air cooling system. The influence of the TIM coverage will be more sensitive since the die/package ratio is lower. In conclusion, Tj will be affected by the external cooling system extremely. Theta JC cannot indicate the overall thermal behavior of the entire system, nor can it be used to define the TIM coverage. While defining the TIM coverage, the quality of the external cooling system should be considered at the same time.
高性能计算应用的TIM覆盖评估
高性能计算(High performance computing, HPC)系统不断提高计算性能,以满足日益增长的挑战,例如高端的CPU (central processing unit)和服务器。针对这一要求,开发了EHS-FCBGA中介于模具顶面与散热器之间的高导热系数(high - k)热界面材料(TIM)来解决过热问题。虽然近年来对高k TIM材料的研究较多,但TIM覆盖率也是影响大功率需求的最重要因素之一。在产品寿命初期(T0),硅基TIM覆盖率通常保持在95%以上,但经过TCT、HTSL等可靠性测试后,往往会出现空洞或分层问题,进而影响实际应用。综上所述,可靠性试验后的TIM覆盖评估优化是必然的。对于系统级冷却,大部分热量通常通过封装的顶部消散。然而,通常使用结壳热阻(Theta JC)来判断封装级向上散热的热性能,这不足以从系统级解释整体热行为。鉴于此,本研究采用包含整体热特性的最高结温(Tj)来定义TIM覆盖范围的限制。在本研究中,我们提出了一种方法,可以在风冷系统下,在不同封装尺寸和模/包比下,确定EHS-FCBGA的热设计功率(TDP)高达100~500W的TIM覆盖限制。由于模具/封装比较低,TIM覆盖率的影响将更加敏感。综上所述,Tj会受到外部冷却系统的极大影响。Theta JC不能表示整个系统的整体热行为,也不能用于定义TIM覆盖率。在确定TIM覆盖范围时,应同时考虑外部冷却系统的质量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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