Yingxuan Zhu, Bowen Jiang, Yong Wang, T. Yuan, Jian Li
{"title":"Use Machine Learning Methods to Predict Lifetimes of Storage Devices","authors":"Yingxuan Zhu, Bowen Jiang, Yong Wang, T. Yuan, Jian Li","doi":"10.1007/978-3-030-55024-0_11","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":245720,"journal":{"name":"TPC Technology Conference","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"TPC Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-030-55024-0_11","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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