Polycrystalline Silicon Thin Film Obtained By Aluminum Induced Crystallization

Abstract

This study is on a new approach for fabrication of poly-Si thin films. Aluminum-induced crystallization of a-Si film has been achieved by thermal annealing only at around 400 °C. The Experimental results reveal that the Al on top of a-Si arrangement has more evident effect in crystallization enhancement than that with Al under a-Si, and the resultant poly-Si films show preferred (400) crystal orientation. It is verified that aluminum can cause lateral crystallization of a-Si film. No preferred orientation was noticed from lateral crystallization samples.