Issues of integrating the IEEE Std 1149.1 into a gate array

Abstract

Use of boundary-scan to test systems at the production and field levels has taken on a greater importance due to the development of surface mount technology. The IEEE Standard 1149.1 offers a documented approach to the implementation of boundary-scan. United Technologies Microelectronics Center (UTMC) integrated the standard into an ASIC gate array; this paper presents that implementation and addresses issues arising from the integration not covered specifically in the standard.<>