Nonlinear transistor modelling based on measurements results

Abstract

A new method for the characterization of microwave measurements has been developed. This method is based upon I(V) and S-parameters measured under pulsed condition thus avoiding the trapping and the thermal effects. The ability of the test-set-up to derive accurate nonlinear models for FET or HBT devices is demonstrated and a model verification with a high power FET has been performed demonstrating the need for accurate nonlinear modelling in the whole working domain.