Initial Design Of A 1 Megawatt Average, 150 Kilovolt Pulse Modulator For An Industrial Plasma Source Ion Implantation Processor

W. Reass, D. Deb
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Abstract

Plasma Source Ion Implantation (PSII) is a materials surface modification process which can be used to improve performance characteristics of manufacturing tooling and products. Since improvements can be realized in surface hardness, reduced friction, wear, galling, and increased resistance to corrosion, PSI1 is applicable to a broad spectrum of manufactured items. In PSII, the object to be implanted is placed in a weakly ionized plasma and pulsed to a high negative voltage. The plasma ions are accelerated into the object's surface, thereby changing its' chemical and physical composition. The plasma dynamic load impedance is highly variable, dependent on implant object area, plasma density, and material composition. The modulator load impedance may be a few tens of ohms and a few thousand picofarads early in time. Late in time, the load may appear as 20,000 Ohms and 100 picofarads. The modulator system must accommodate any process changes, in addition to (frequent) initial "start-up" object arcs (from impurities). To implant the required ion densities in a minimum of time, multi-kilohertz rep-rates are often required. An evolutionary design approach was utilized to design a cost-effective and reliable modulator system with components of established performance, suitable for a manufacturing environment. This paper, in addition to presenting the anticipated modulator design required for the PSI1 application, wi l l review similar modulator topologies and determine operational lifetime characteristics. Further improvements in system electrical efficiency can also be realized with incremental design modifications to the high voltage switch tubes. Development options for upgraded switch tubes of higher efficiency will also be presented.
用于工业等离子体源离子注入处理器的平均功率为1兆瓦、150千伏脉冲调制器的初步设计
等离子体源离子注入(PSII)是一种材料表面改性工艺,可用于改善制造工具和产品的性能特征。由于可以改善表面硬度,减少摩擦,磨损,磨损和增强抗腐蚀性,PSI1适用于广泛的制造项目。在PSII中,要植入的物体被放置在弱电离等离子体中并脉冲到高负电压。等离子体离子被加速进入物体表面,从而改变其化学和物理组成。等离子体动态负载阻抗是高度可变的,取决于植入物的面积、等离子体密度和材料成分。调制器负载阻抗早期可能是几十欧姆和几千皮法。晚些时候,负载可能出现20,000欧姆和100皮卡。调制器系统必须适应任何工艺变化,除了(频繁的)初始“启动”对象电弧(来自杂质)。为了在最短的时间内植入所需的离子密度,通常需要几千赫兹的重复率。采用进化设计方法设计了具有既定性能的组件,适合制造环境的经济可靠的调制器系统。本文除了介绍PSI1应用所需的预期调制器设计外,还将回顾类似的调制器拓扑并确定工作寿命特性。进一步提高系统电气效率也可以实现增量设计修改高压开关管。还将介绍提高效率的升级开关管的开发方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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