Improved TEM-cell for EMC tests of integrated circuits

Abstract

In this paper, the construction of TEM-cell, which can be used for tests on radiated susceptibility and emissions of integrated circuits in the frequency range up to 5 GHz, is presented. Constructional features and advantages of proposed TEM-cell compared with classic constriction are described. Electrodynamic simulation of construction is completed and results of the analysis of frequency dependencies of the magnitude of reflection |511| and transmission |S21| coefficients are presented. Results of the simulation showed good matching with the 50 Ohm feeder (|S11| ≤ −20 dB) and low losses (|S21| ≥ −3 dB) in considered frequency range. Evaluation of non-uniformity of electric field strength in test volume is represented. Its value doesn't exceed ±3 dB in the test volume of 30×30×5 mm³.