Kuan-Yu Tseng, Daniel Chen, Z. Kalbarczyk, R. Iyer
{"title":"Characterization of the error resiliency of power grid substation devices","authors":"Kuan-Yu Tseng, Daniel Chen, Z. Kalbarczyk, R. Iyer","doi":"10.1109/DSN.2012.6263924","DOIUrl":null,"url":null,"abstract":"With the advent of modern technologies, microprocessor-based devices are used to monitor and control critical infrastructures, e.g., electric power grids, oil and gas distribution. However, the security and reliability of these microprocessor-based systems is a significant issue, since they are more susceptible to transient errors and malicious attacks. An error in one of these systems could have a cascading and catastrophic impact on the whole infrastructure. This paper explores the error resiliency of power grid substation devices. A software-implemented fault injection technique is used to induce errors/faults inside devices used in power grid substations. The goal is to test the ability of these systems to compute through errors/faults. Our results demonstrate that a single error in a substation device may render the operator in the control center unable to control the operation of a relay in the substation.","PeriodicalId":236791,"journal":{"name":"IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012)","volume":"236 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DSN.2012.6263924","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
With the advent of modern technologies, microprocessor-based devices are used to monitor and control critical infrastructures, e.g., electric power grids, oil and gas distribution. However, the security and reliability of these microprocessor-based systems is a significant issue, since they are more susceptible to transient errors and malicious attacks. An error in one of these systems could have a cascading and catastrophic impact on the whole infrastructure. This paper explores the error resiliency of power grid substation devices. A software-implemented fault injection technique is used to induce errors/faults inside devices used in power grid substations. The goal is to test the ability of these systems to compute through errors/faults. Our results demonstrate that a single error in a substation device may render the operator in the control center unable to control the operation of a relay in the substation.