Optical Response to Submicron Digital Elements Simulated by FDTD Wavelets with Refractive Impulse

Abstract

Accurate simulation from digital, submicron, optical elements is obtained by finite difference time domain (FDTD) results that are phase analyzed as sources for Huygens wavelets on fine scales much shorter than the wavelength used. Results, from the MIT electromagnetic evaluation program, are renormalized by a method here called “refractive impulse.” This is valid for polarized responses from digital diffractive and focusing optics. The method is employed with plane wave incidence at any angle or with diverging or converging beams. It is more systematic, more versatile, and more accurate than commercial substitutes.