A low power CMOS amplitude peak detector for on-chip self-calibration applications

Shuo Li, H. Xue, Xiaomeng Zhang, S. Ren
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引用次数: 1

Abstract

A CMOS 90 nm technology peak detector is presented in this paper used for detecting active circuit process, voltage, temperature (PVT) variation error. The detector can transfer AC input amplitude to corresponding DC voltage. Such DC output can be recognized and compared to determine whether active circuit needs to be compensated to eliminate the PVT variation error. The detection output range is from 100 mV to 680 mV, corresponding to input amplitude varying from 100 mV to 500 mV. The detective frequency range is 1.0 GHz to 10.0 GHz. The power consumption is 0.4 mW with 500 mV input amplitude and 6.0 GHz input frequency under 1.2 V power supply with 1 pF capacitive load.
低功耗CMOS振幅峰值检测器片上自校准应用
本文介绍了一种用于有源电路过程、电压、温度(PVT)变化误差检测的CMOS 90 nm工艺峰值检测器。该检测器可将交流输入幅值转换为相应的直流电压。这样的直流输出可以被识别和比较,以确定是否需要补偿有源电路,以消除PVT变化误差。检测输出范围为100mv ~ 680mv,对应输入幅度为100mv ~ 500mv。检测频率范围为1.0 GHz ~ 10.0 GHz。功耗为0.4 mW,输入幅值为500 mV,输入频率为6.0 GHz,电源为1.2 V,容性负载为1pf。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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