Investigation of NiV-based multilayers for the high energy x-ray probe

N. Gellert, K. Madsen, S. Massahi, Diego Paredes Sanz, D. Ferreira, S. Svendsen, A. S. Jegers, F. Christensen
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Abstract

The High Energy X-ray Probe (HEX-P) is a NASA probe-class mission concept that will combine high spatial resolution x-ray imaging (⪅10 arcsec FWHM) and broad spectral coverage (0.1 to 150 keV) with an effective area far superior to current facilities (including XMM-Newton and NuSTAR) to enable revolutionary new insights into a variety of important astrophysical problems. Optimized nanometer-thin Ni-based multilayer coatings enable high performance of focusing X-ray telescopes to energies up to 150 keV and beyond, though current fabricated Ni-based coatings contain high interfacial roughness which will affect the predicted performance of the telescope. As part of the thin film coating development for the High Energy X-ray Probe, we report on the current development of reducing the coating roughness in periodic NiV/Si multilayer coatings. The multilayers are fabricated using the direct current magnetron sputtering coating facility at DTU Space, using different types of sputtering collimators and different reactive sputtering gas concentrations, optimized for the production of low interfacial roughness. The multilayers are characterized using x-ray reflectometry and x-ray photoelectron spectroscopy. More information on HEX-P, including the full team list, is available at hexp.org.
高能x射线探针用niv多层材料的研究
高能x射线探测器(hexx - p)是NASA的探测级任务概念,它将结合高空间分辨率x射线成像(10弧秒FWHM)和广谱覆盖(0.1至150 keV),有效面积远远优于当前的设施(包括XMM-Newton和NuSTAR),从而能够对各种重要的天体物理问题产生革命性的新见解。优化的纳米薄镍基多层涂层使x射线望远镜的聚焦性能达到150 keV甚至更高,尽管目前制造的镍基涂层含有高界面粗糙度,这将影响望远镜的预测性能。作为高能x射线探针薄膜涂层发展的一部分,我们报告了降低周期性NiV/Si多层涂层粗糙度的最新进展。利用DTU空间的直流磁控溅射镀膜设备,使用不同类型的溅射准直器和不同的反应溅射气体浓度制备了多层膜,优化了低界面粗糙度的生产。用x射线反射法和x射线光电子能谱法对多层材料进行了表征。更多关于HEX-P的信息,包括完整的团队名单,可以在hexp.org上找到。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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