Study on CMOS Sensor Irradiation Damage and Evaluation of System Performance Degradation

Abstract

The CMOS sensor in space optical communication system may generate irradiation-induced noise, leading to deviation of image centroid. Total ionization dose (TID) test and displacement damage (DD) test are carried out. It shows that dark current increases 56.6times and 15.3 times, respectively. The quality of imaging decreases with the irradiation-induced bad points increasing. Based on test, simulated defect spots have been used for calculating the image centroid value by grey-level centroid algorithm. It shows that Centroid deviation value is about 1 pixel for the point defects case, while it is about 6 pixels for all random defects case. Both the amount and position of defect pixels contribute to deviation of image centroid and the accuracy decreasing. For the given optical communication system, When the deviation value of centroid position is 1pixel, beam direction changes about 6μrad, having a serious effect