Comparative analysis of the impact of multiple faults on the performance of fast repulsion mechanism

Linru Ning, Zhaowei Peng, Dangguo Xu, P. Song, Yamei Li, S. Huang
{"title":"Comparative analysis of the impact of multiple faults on the performance of fast repulsion mechanism","authors":"Linru Ning, Zhaowei Peng, Dangguo Xu, P. Song, Yamei Li, S. Huang","doi":"10.1109/ICDSCA56264.2022.9988028","DOIUrl":null,"url":null,"abstract":"The fast repulsion mechanism plays a crucial role in fast mechanical switching, and although the structure is simple, it is prone to certain failures. To address this issue, this paper first gives a brief overview of the working principle of the fast repulsive mechanism, builds a simulation model of the fast repulsive mechanism using Maxwell, studies three kinds of failures caused by the repulsive disc damage, jamming and unstable capacitor charging voltage, and simulates the above three types of failures and the normal operation state separately for comparative analysis. The results show that when the repulsive disc is damaged, the electromagnetic repulsion force and movement speed will decrease with the increase of the crack depth when the crack depth of the repulsive disc gradually increases; when the jamming force gradually increases, the displacement and movement speed will decrease with the increase of the jamming force; when the capacitor charging voltage gradually decreases, the coil current, electromagnetic repulsion force and displacement will decrease with the decrease of the capacitor, and even cannot the normal division of the gate.","PeriodicalId":416983,"journal":{"name":"2022 IEEE 2nd International Conference on Data Science and Computer Application (ICDSCA)","volume":"42 3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE 2nd International Conference on Data Science and Computer Application (ICDSCA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICDSCA56264.2022.9988028","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The fast repulsion mechanism plays a crucial role in fast mechanical switching, and although the structure is simple, it is prone to certain failures. To address this issue, this paper first gives a brief overview of the working principle of the fast repulsive mechanism, builds a simulation model of the fast repulsive mechanism using Maxwell, studies three kinds of failures caused by the repulsive disc damage, jamming and unstable capacitor charging voltage, and simulates the above three types of failures and the normal operation state separately for comparative analysis. The results show that when the repulsive disc is damaged, the electromagnetic repulsion force and movement speed will decrease with the increase of the crack depth when the crack depth of the repulsive disc gradually increases; when the jamming force gradually increases, the displacement and movement speed will decrease with the increase of the jamming force; when the capacitor charging voltage gradually decreases, the coil current, electromagnetic repulsion force and displacement will decrease with the decrease of the capacitor, and even cannot the normal division of the gate.
多故障对快速斥力机构性能影响的对比分析
快速斥力机构在快速机械开关中起着至关重要的作用,虽然结构简单,但容易出现一定的故障。针对这一问题,本文首先简要概述了快速斥力机构的工作原理,利用Maxwell建立了快速斥力机构的仿真模型,研究了斥力盘损坏、卡壳和电容充电电压不稳定引起的三种故障,并分别对上述三种故障和正常运行状态进行了仿真比较分析。结果表明:当排斥盘损坏时,当排斥盘裂纹深度逐渐增加时,电磁斥力和运动速度随裂纹深度的增加而减小;当干扰力逐渐增大时,位移和运动速度随干扰力的增大而减小;当电容器充电电压逐渐降低时,线圈电流、电磁斥力和位移都会随着电容器的减小而减小,甚至不能正常分栅。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信